Strong Pinned-Spin-Mediated Memory Effect in NiO Nanoparticles
نویسندگان
چکیده
منابع مشابه
Strong Pinned-Spin-Mediated Memory Effect in NiO Nanoparticles
After a decade of effort, a large number of magnetic memory nanoparticles with different sizes and core/shell compositions have been developed. While the field-cooling memory effect is often attributed to particle size and distribution effects, other magnetic coupling parameters such as inter- and intra-coupling strength, exchange bias, interfacial pinned spins, and the crystallinity of the nan...
متن کاملErratum to: Strong Pinned-Spin-Mediated Memory Effect in NiO Nanoparticles
Erratum In the original publication [1] was an error in the authors contribution. The correct version can be found here: “SYW and ACG wrote, conceived, and designed the experiments. ACG and JP grew the samples and analyzed the data. TSC and JP contributed the experimental facilities and valuable discussions. All authors discussed the results, contributed to the manuscript text, commented on the...
متن کاملStrong Deep-Level-Emission Photoluminescence in NiO Nanoparticles
Nickel oxide is one of the highly promising semiconducting materials, but its large band gap (3.7 to 4 eV) limits its use in practical applications. Here we report the effect of nickel/oxygen vacancies and interstitial defects on the near-band-edge (NBE) and deep-level-emission (DLE) in various sizes of nickel oxide (NiO) nanoparticles. The ultraviolet (UV) emission originated from excitonic re...
متن کاملSize-dependent magnetization fluctuations in NiO nanoparticles
The finite size and surface roughness effects on the magnetization of NiO nanoparticles is investigated. A large magnetic moment arises for an antiferromagnetic nanoparticle due to these effects. The magnetic moment without the surface roughness has a non-monotonic and oscillatory dependence on R, the size of the particles, with the amplitude of the fluctuations varying linearly with R. However...
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ژورنال
عنوان ژورنال: Nanoscale Research Letters
سال: 2017
ISSN: 1931-7573,1556-276X
DOI: 10.1186/s11671-017-1988-x